Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification
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Zulfikar, Z.; Walidainy, H.; Rahman, A.; Muchtar, K. Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification. Cryptography 2025, 9, 36. https://doi.org/10.3390/cryptography9020036
Zulfikar Z, Walidainy H, Rahman A, Muchtar K. Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification. Cryptography. 2025; 9(2):36. https://doi.org/10.3390/cryptography9020036
Chicago/Turabian StyleZulfikar, Zulfikar, Hubbul Walidainy, Aulia Rahman, and Kahlil Muchtar. 2025. "Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification" Cryptography 9, no. 2: 36. https://doi.org/10.3390/cryptography9020036
APA StyleZulfikar, Z., Walidainy, H., Rahman, A., & Muchtar, K. (2025). Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification. Cryptography, 9(2), 36. https://doi.org/10.3390/cryptography9020036

