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Journal: PhotonicsVolume: 8Number: 529
Article: Real-Time Double-Layer Thin Film Thickness Measurements Using Modified Sagnac Interferometer with Polarization Phase Shifting Approach
  • Authors:
  • Abdullahi Usman1,
  • Apichai Bhatranand1,* and
  • Yuttapong Jiraraksopakun1
  • et al.
Link: https://www.mdpi.com/2304-6732/8/12/529

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