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Journal: Photonics, 2021
Volume: 8
Number: 529
Article:
Real-Time Double-Layer Thin Film Thickness Measurements Using Modified Sagnac Interferometer with Polarization Phase Shifting Approach
Authors:
by
Abdullahi Usman, Apichai Bhatranand, Yuttapong Jiraraksopakun, Rapeepan Kaewon and Chutchai Pawong
Link:
https://www.mdpi.com/2304-6732/8/12/529
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