Next Article in Journal
Blind Phase Search with Angular Quantization Noise Mitigation for Efficient Carrier Phase Recovery
Next Article in Special Issue
Analytical Model of the Optical Vortex Scanning Microscope with a Simple Phase Object
Previous Article in Journal
Coupling of Surface Plasmon Polariton in Al-Doped ZnO with Fabry-Pérot Resonance for Total Light Absorption
Previous Article in Special Issue
XL-SIM: Extending Superresolution into Deeper Layers
Open AccessArticle

Label-Free Saturated Structured Excitation Microscopy

1
Department of Chemistry and Biochemistry, Montana State University, Bozeman, MT 59717, USA
2
Montana Materials Science Program, Montana State University, Bozeman, MT 59717, USA
*
Author to whom correspondence should be addressed.
Photonics 2017, 4(2), 36; https://doi.org/10.3390/photonics4020036
Received: 14 March 2017 / Revised: 17 April 2017 / Accepted: 2 May 2017 / Published: 5 May 2017
(This article belongs to the Special Issue Superresolution Optical Microscopy)
Micro- and nanoscale chemical and structural heterogeneities, whether they are intrinsic material properties like grain boundaries or intentionally encoded via nanoscale fabrication techniques, pose a challenge to current material characterization methods. To precisely interrogate the electronic structure of these complex materials systems, spectroscopic techniques with high spatial resolution are required. However, conventional optical microscopies are limited to probe volumes of ~200 nm due to the diffraction limit of visible light. While a variety of sub-diffraction-limited techniques have been developed, many rely on fluorescent contrast agents. Herein we describe label-free saturated structured excitation microscopy (LF-SSEM) applicable to nonlinear imaging approaches such as stimulated Raman and pump-probe microscopy. By exploiting the nonlinear sample response of saturated excitation, LF-SSEM provides theoretically limitless resolution enhancement without the need for a photoluminescent sample. View Full-Text
Keywords: saturated structured illumination; super-resolution; nonlinear microscopy saturated structured illumination; super-resolution; nonlinear microscopy
Show Figures

Graphical abstract

MDPI and ACS Style

Massaro, E.S.; Grumstrup, E.M. Label-Free Saturated Structured Excitation Microscopy. Photonics 2017, 4, 36. https://doi.org/10.3390/photonics4020036

AMA Style

Massaro ES, Grumstrup EM. Label-Free Saturated Structured Excitation Microscopy. Photonics. 2017; 4(2):36. https://doi.org/10.3390/photonics4020036

Chicago/Turabian Style

Massaro, Eric S.; Grumstrup, Erik M. 2017. "Label-Free Saturated Structured Excitation Microscopy" Photonics 4, no. 2: 36. https://doi.org/10.3390/photonics4020036

Find Other Styles
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Search more from Scilit
 
Search
Back to TopTop