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Open AccessArticle

Label-Free Saturated Structured Excitation Microscopy

Department of Chemistry and Biochemistry, Montana State University, Bozeman, MT 59717, USA
Montana Materials Science Program, Montana State University, Bozeman, MT 59717, USA
Author to whom correspondence should be addressed.
Photonics 2017, 4(2), 36;
Received: 14 March 2017 / Revised: 17 April 2017 / Accepted: 2 May 2017 / Published: 5 May 2017
(This article belongs to the Special Issue Superresolution Optical Microscopy)
Micro- and nanoscale chemical and structural heterogeneities, whether they are intrinsic material properties like grain boundaries or intentionally encoded via nanoscale fabrication techniques, pose a challenge to current material characterization methods. To precisely interrogate the electronic structure of these complex materials systems, spectroscopic techniques with high spatial resolution are required. However, conventional optical microscopies are limited to probe volumes of ~200 nm due to the diffraction limit of visible light. While a variety of sub-diffraction-limited techniques have been developed, many rely on fluorescent contrast agents. Herein we describe label-free saturated structured excitation microscopy (LF-SSEM) applicable to nonlinear imaging approaches such as stimulated Raman and pump-probe microscopy. By exploiting the nonlinear sample response of saturated excitation, LF-SSEM provides theoretically limitless resolution enhancement without the need for a photoluminescent sample. View Full-Text
Keywords: saturated structured illumination; super-resolution; nonlinear microscopy saturated structured illumination; super-resolution; nonlinear microscopy
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MDPI and ACS Style

Massaro, E.S.; Grumstrup, E.M. Label-Free Saturated Structured Excitation Microscopy. Photonics 2017, 4, 36.

AMA Style

Massaro ES, Grumstrup EM. Label-Free Saturated Structured Excitation Microscopy. Photonics. 2017; 4(2):36.

Chicago/Turabian Style

Massaro, Eric S.; Grumstrup, Erik M. 2017. "Label-Free Saturated Structured Excitation Microscopy" Photonics 4, no. 2: 36.

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