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Open AccessArticle

Extreme Ultraviolet Stokesmeter for Pulsed Magneto-Optics

EMPA, Materials Science and Technology, Überlandstrasse 129, Dübendorf CH-8600, Switzerland
Laboratory for Micro- and Nanotechnology, Paul Scherrer Institute, Villigen PSI CH-5232, Switzerland
Institut für Angewandte Physik, University of Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland
Author to whom correspondence should be addressed.
Photonics 2015, 2(1), 241-255;
Received: 9 January 2015 / Revised: 7 February 2015 / Accepted: 9 February 2015 / Published: 16 February 2015
(This article belongs to the Special Issue Extreme UV Lasers: Technologies and Applications)
Several applications in material science and magnetic holography using extreme ultraviolet (EUV) radiation require the measurement of the degree and state of polarization. In this work, an instrument to measure simultaneously both parameters from EUV pulses is presented. The instrument determines the Stokes parameters after a reflection on an array of multilayer mirrors at the Brewster angle. The Stokesmeter was tested at Swiss Light Source at different EUV wavelengths. The experimental Stokes patterns of the source were compared with the simulated pattern. View Full-Text
Keywords: polarization; synchrotron; extreme ultraviolet; ellipsometry polarization; synchrotron; extreme ultraviolet; ellipsometry
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MDPI and ACS Style

Ruiz-Lopez, M.; Barbato, F.; Ekinci, Y.; Bleiner, D. Extreme Ultraviolet Stokesmeter for Pulsed Magneto-Optics. Photonics 2015, 2, 241-255.

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