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Journal: Photonics, 2025
Volume: 12
Number: 234

Article: Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation
Authors: by Daniel Schmid, René Eisermann, Anna Peczek, Georg Winzer, Lars Zimmermann and Stephan Krenek
Link: https://www.mdpi.com/2304-6732/12/3/234

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