Wu, Z.; He, Y.; Huo, D.; Zhu, Z.; Yang, Y.; Du, Z.
Multi-Scale Attention-Augmented YOLOv8 for Real-Time Surface Defect Detection in Fresh Soybeans. Processes 2025, 13, 3040.
https://doi.org/10.3390/pr13103040
AMA Style
Wu Z, He Y, Huo D, Zhu Z, Yang Y, Du Z.
Multi-Scale Attention-Augmented YOLOv8 for Real-Time Surface Defect Detection in Fresh Soybeans. Processes. 2025; 13(10):3040.
https://doi.org/10.3390/pr13103040
Chicago/Turabian Style
Wu, Zhili, Yakai He, Da Huo, Zhiyou Zhu, Yanchen Yang, and Zhilong Du.
2025. "Multi-Scale Attention-Augmented YOLOv8 for Real-Time Surface Defect Detection in Fresh Soybeans" Processes 13, no. 10: 3040.
https://doi.org/10.3390/pr13103040
APA Style
Wu, Z., He, Y., Huo, D., Zhu, Z., Yang, Y., & Du, Z.
(2025). Multi-Scale Attention-Augmented YOLOv8 for Real-Time Surface Defect Detection in Fresh Soybeans. Processes, 13(10), 3040.
https://doi.org/10.3390/pr13103040