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Journal: Mathematics, 2021
Volume: 9
Number: 1209
Article:
Defect Detection in Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning
Authors:
by
Philip Cho, Aihua Wood, Krishnamurthy Mahalingam and Kurt Eyink
Link:
https://www.mdpi.com/2227-7390/9/11/1209
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