Wu, P.-H.; Hoang, T.P.; Chou, Y.-T.; Mayol, A.P.; Lai, Y.-W.; Kang, C.-H.; Chan, Y.-C.; Lin, S.-Z.; Chen, S.-H.
Elevating Wafer Defect Inspection with Denoising Diffusion Probabilistic Model. Mathematics 2024, 12, 3164.
https://doi.org/10.3390/math12203164
AMA Style
Wu P-H, Hoang TP, Chou Y-T, Mayol AP, Lai Y-W, Kang C-H, Chan Y-C, Lin S-Z, Chen S-H.
Elevating Wafer Defect Inspection with Denoising Diffusion Probabilistic Model. Mathematics. 2024; 12(20):3164.
https://doi.org/10.3390/math12203164
Chicago/Turabian Style
Wu, Ping-Hung, Thi Phuong Hoang, Yen-Ting Chou, Andres Philip Mayol, Yu-Wei Lai, Chih-Hsiang Kang, Yu-Cheng Chan, Siou-Zih Lin, and Ssu-Han Chen.
2024. "Elevating Wafer Defect Inspection with Denoising Diffusion Probabilistic Model" Mathematics 12, no. 20: 3164.
https://doi.org/10.3390/math12203164
APA Style
Wu, P.-H., Hoang, T. P., Chou, Y.-T., Mayol, A. P., Lai, Y.-W., Kang, C.-H., Chan, Y.-C., Lin, S.-Z., & Chen, S.-H.
(2024). Elevating Wafer Defect Inspection with Denoising Diffusion Probabilistic Model. Mathematics, 12(20), 3164.
https://doi.org/10.3390/math12203164
