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Open AccessArticle

SET Pulse Characterization and SER Estimation in Combinational Logic with Placement and Multiple Transient Faults Considerations

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Department of Electrical and Computer Engineering, University of Thessaly, 38221 Volos, Greece
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Department of Computer Science, University of Thessaly, 35131 Lamia, Greece
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Authors to whom correspondence should be addressed.
This paper is an extended version of our paper published in the Proceedings of the 8th International Conference on Modern Circuits and Systems Technologies on Electronics and Communications (MOCAST 2019), Thessaloniki, Greece, 13–15 May 2019.
Technologies 2020, 8(1), 5; https://doi.org/10.3390/technologies8010005
Received: 2 December 2019 / Revised: 31 December 2019 / Accepted: 7 January 2020 / Published: 10 January 2020
(This article belongs to the Special Issue MOCAST 2019: Modern Circuits and Systems Technologies on Electronics)
Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the problem. Thus, the evaluation of Soft Error Rate (SER) in the presence of multiple transient faults is necessary, since it remains an open research field. In this work, a Monte-Carlo simulation-based methodology is presented taking into consideration the masking mechanisms and placement information. The proposed SER estimation tool exploits the results of a Single Event Transient (SET) pulse characterization process with HSPICE to obtain an accurate assessment of circuit vulnerability to radiation. A new metric, called Glitch Latching Probability, which represents the impact of the masking effects on a SET, is introduced to identify gate sensitivity and, finally, experimental results on a set of ISCAS’ 89 benchmarks are presented. View Full-Text
Keywords: characterization; masking effects; fan-out variation; temperature variation; voltage variation; multiple transient faults; sensitive gates; soft error rate; susceptibility characterization; masking effects; fan-out variation; temperature variation; voltage variation; multiple transient faults; sensitive gates; soft error rate; susceptibility
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Paliaroutis, G.I.; Tsoumanis, P.; Evmorfopoulos, N.; Dimitriou, G.; Stamoulis, G.I. SET Pulse Characterization and SER Estimation in Combinational Logic with Placement and Multiple Transient Faults Considerations. Technologies 2020, 8, 5.

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