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Journal: Technologies, 2024
Volume: 12
Number: 102

Article: Technique of High-Field Electron Injection for Wafer-Level Testing of Gate Dielectrics of MIS Devices
Authors: by Dmitrii V. Andreev, Vladimir V. Andreev, Marina Konuhova and Anatoli I. Popov
Link: https://www.mdpi.com/2227-7080/12/7/102

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