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Journal: Technologies, 2024
Volume: 12
Number: 87
87
Article: Electron Energy-Loss Spectroscopy Method for Thin-Film Thickness Calculations with a Low Incident Energy Electron Beam
Authors: by Ahmad M. D. (Assa’d) Jaber, Ammar Alsoud, Saleh R. Al-Bashaish, Hmoud Al Dmour, Marwan S. Mousa, Tomáš Trčka, Vladimír Holcman and Dinara Sobola
Link: https://www.mdpi.com/2227-7080/12/6/87

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