Chen, K.; Kumar, P.; Jia, G.; Chen, H.; Zhang, Y.; Bux, H.; Zheng, S.; Zhou, X.
Agronomic Performance and Dual Resistance Evaluation to Powdery Mildew and Stripe Rust in 660 Wheat Germplasm Lines. Plants 2026, 15, 2859.
https://doi.org/10.3390/plants15182859
AMA Style
Chen K, Kumar P, Jia G, Chen H, Zhang Y, Bux H, Zheng S, Zhou X.
Agronomic Performance and Dual Resistance Evaluation to Powdery Mildew and Stripe Rust in 660 Wheat Germplasm Lines. Plants. 2026; 15(18):2859.
https://doi.org/10.3390/plants15182859
Chicago/Turabian Style
Chen, Kebei, Pardeep Kumar, Guoyun Jia, Hao Chen, Yiduo Zhang, Hadi Bux, Shouhang Zheng, and Xinli Zhou.
2026. "Agronomic Performance and Dual Resistance Evaluation to Powdery Mildew and Stripe Rust in 660 Wheat Germplasm Lines" Plants 15, no. 18: 2859.
https://doi.org/10.3390/plants15182859
APA Style
Chen, K., Kumar, P., Jia, G., Chen, H., Zhang, Y., Bux, H., Zheng, S., & Zhou, X.
(2026). Agronomic Performance and Dual Resistance Evaluation to Powdery Mildew and Stripe Rust in 660 Wheat Germplasm Lines. Plants, 15(18), 2859.
https://doi.org/10.3390/plants15182859