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Journal: Electronics, 2020
Volume: 9
Number: 730
Article:
Robust ESD-Reliability Design of 300-V Power N-Channel LDMOSs with the Elliptical Cylinder Super-Junctions in the Drain Side
Authors:
by
Shen-Li Chen, Pei-Lin Wu and Yu-Jen Chen
Link:
https://www.mdpi.com/2079-9292/9/5/730
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