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Journal: Electronics, 2020
Volume: 9
Number: 388

Article: New Radiation-Hardened Design of a CMOS Instrumentation Amplifier and its Tolerant Characteristic Analysis
Authors: by Minwoong Lee, Seongik Cho, Namho Lee and Jongyeol Kim
Link: https://www.mdpi.com/2079-9292/9/3/388

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