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Journal: Electronics, 2020
Volume: 9
Number: 1652

Article: Numerical Study of Sub-Gap Density of States Dependent Electrical Characteristics in Amorphous In-Ga-Zn-O Thin-Film Transistors
Authors: by Do-Kyung Kim, Jihwan Park, Xue Zhang, Jaehoon Park and Jin-Hyuk Bae
Link: https://www.mdpi.com/2079-9292/9/10/1652

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