Next Article in Journal
Single-Switch LED Post-Regulator Based on a Modified Class-E Resonant Converter with Voltage Clamp
Previous Article in Journal
Maximum Transmit Power for UE in an LTE Small Cell Uplink
Open AccessArticle

Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics

1
Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon 16419, Korea
2
Electronics Engineering Design Team 1, MANDO Corp., Seongnam 463400, Korea
*
Author to whom correspondence should be addressed.
These authors contributed equal to this work.
Electronics 2019, 8(7), 797; https://doi.org/10.3390/electronics8070797
Received: 21 June 2019 / Revised: 12 July 2019 / Accepted: 13 July 2019 / Published: 16 July 2019
(This article belongs to the Section Microwave and Wireless Communications)
  |  
PDF [3542 KB, uploaded 16 July 2019]
  |  

Abstract

This study presents a near-field immunity test (NFIT) method for the fast debugging of radiated susceptibility of industrial devices. The proposed approach is based on the development of an NFIT setup which comprises of developed near-field electric and magnetic field probes and device under test (DUT). The developed small-size and handy near-field testing probes inject the high electric (up to 1000 V/m) and magnetic (up to 2.4 A/m) fields on the DUT in the radar pulse ranges (1.2 to 1.4 GHz and 2.7 to 3.1 GHz) with the lower fed input power (up to 15 W) from the power amplifier in the developed NFIT setup. The proof of concept is validated with the successful near-field immunity debugging of an electric power steering (EPS) device used in the automotive industry with the developed NFIT setup. The radiated susceptibility debugging test results of developed NFIT method and conventional method of ISO 11452-2 test setup turned out to be close to each other for the tested DUT in immunity performance. The proposed procedure has advantages of industry usefulness with fast, handy, and cost-effective radiated immunity debugging of the DUT without the requirement of large antenna, high-power amplifiers, optical DUT connecting harness, and an anechoic chamber as needed in ISO 11452-2 standard setup for the debugging analysis. View Full-Text
Keywords: radiated immunity (RI) test; near-field immunity test (NFIT); ISO 11452-2; automotive; radar pulse range; L-probe fed circular patch antenna; H-field probe radiated immunity (RI) test; near-field immunity test (NFIT); ISO 11452-2; automotive; radar pulse range; L-probe fed circular patch antenna; H-field probe
Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
SciFeed

Share & Cite This Article

MDPI and ACS Style

Yousaf, J.; Lee, D.; Han, J.; Lee, H.; Faisal, M.; Kim, J.; Nah, W. Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics. Electronics 2019, 8, 797.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Electronics EISSN 2079-9292 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top