Yousaf, J.; Lee, D.; Han, J.; Lee, H.; Faisal, M.; Kim, J.; Nah, W.
Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics. Electronics 2019, 8, 797.
https://doi.org/10.3390/electronics8070797
AMA Style
Yousaf J, Lee D, Han J, Lee H, Faisal M, Kim J, Nah W.
Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics. Electronics. 2019; 8(7):797.
https://doi.org/10.3390/electronics8070797
Chicago/Turabian Style
Yousaf, Jawad, Doojin Lee, JunHee Han, Hosang Lee, Muhammad Faisal, Jeongeun Kim, and Wansoo Nah.
2019. "Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics" Electronics 8, no. 7: 797.
https://doi.org/10.3390/electronics8070797
APA Style
Yousaf, J., Lee, D., Han, J., Lee, H., Faisal, M., Kim, J., & Nah, W.
(2019). Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics. Electronics, 8(7), 797.
https://doi.org/10.3390/electronics8070797