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Journal: Electronics, 2019
Volume: 8
Number: 797
Article:
Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics
Authors:
by
Jawad Yousaf, Doojin Lee, JunHee Han, Hosang Lee, Muhammad Faisal, Jeongeun Kim and Wansoo Nah
Link:
https://www.mdpi.com/2079-9292/8/7/797
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