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Journal: Electronics, 2019
Volume: 8
Number: 797

Article: Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics
Authors: by Jawad Yousaf, Doojin Lee, JunHee Han, Hosang Lee, Muhammad Faisal, Jeongeun Kim and Wansoo Nah
Link: https://www.mdpi.com/2079-9292/8/7/797

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