Bian, Y.; Gu, Y.; Ding, X.; Wang, Z.; Mo, J.; Yu, F.
MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures. Electronics 2018, 7, 208.
https://doi.org/10.3390/electronics7090208
AMA Style
Bian Y, Gu Y, Ding X, Wang Z, Mo J, Yu F.
MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures. Electronics. 2018; 7(9):208.
https://doi.org/10.3390/electronics7090208
Chicago/Turabian Style
Bian, Yue, Yifan Gu, Xu Ding, Zhiyu Wang, Jiongjiong Mo, and Faxin Yu.
2018. "MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures" Electronics 7, no. 9: 208.
https://doi.org/10.3390/electronics7090208
APA Style
Bian, Y., Gu, Y., Ding, X., Wang, Z., Mo, J., & Yu, F.
(2018). MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures. Electronics, 7(9), 208.
https://doi.org/10.3390/electronics7090208