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Journal: Electronics, 2017
Volume: 6
Number: 28

Article: High Throughput Characterization of Epitaxially Grown Single-Layer MoS2
Authors: by Foad Ghasemi, Riccardo Frisenda, Dumitru Dumcenco, Andras Kis, David Perez de Lara and Andres Castellanos-Gomez
Link: https://www.mdpi.com/2079-9292/6/2/28

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