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Journal: Electronics, 2015
Volume: 4
Number: 614

Article: Intermodulation Linearity in High-k/Metal Gate 28 nm RF CMOS Transistors
Authors: by Zhen Li, Guofu Niu, Qingqing Liang and Kimihiko Imura
Link: https://www.mdpi.com/2079-9292/4/3/614

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