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        Journal: Electronics, 2015
        Volume: 4 
                	Number: 614 
                
        
        Article:
        Intermodulation Linearity in High-k/Metal Gate 28 nm RF CMOS Transistors 
        Authors: 
       	by
                    Zhen Li, Guofu Niu, Qingqing Liang and Kimihiko Imura        
        Link:
        https://www.mdpi.com/2079-9292/4/3/614
        
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