Lu, X.; An, S.; Chen, J.; Shu, Z.; Wang, W.; Qi, R.; Diao, Y.
BERT-LogAnom: Enhancing Log Anomaly Detection with Gated Residual BiLSTM and Dynamic Thresholding. Electronics 2026, 15, 806.
https://doi.org/10.3390/electronics15040806
AMA Style
Lu X, An S, Chen J, Shu Z, Wang W, Qi R, Diao Y.
BERT-LogAnom: Enhancing Log Anomaly Detection with Gated Residual BiLSTM and Dynamic Thresholding. Electronics. 2026; 15(4):806.
https://doi.org/10.3390/electronics15040806
Chicago/Turabian Style
Lu, Xi, Shufan An, Jingmei Chen, Zhan Shu, Weiping Wang, Runyi Qi, and Yapeng Diao.
2026. "BERT-LogAnom: Enhancing Log Anomaly Detection with Gated Residual BiLSTM and Dynamic Thresholding" Electronics 15, no. 4: 806.
https://doi.org/10.3390/electronics15040806
APA Style
Lu, X., An, S., Chen, J., Shu, Z., Wang, W., Qi, R., & Diao, Y.
(2026). BERT-LogAnom: Enhancing Log Anomaly Detection with Gated Residual BiLSTM and Dynamic Thresholding. Electronics, 15(4), 806.
https://doi.org/10.3390/electronics15040806