1. Introduction
Rectangular microstrip antenna (RMA) has been widely applied in satellite communications, radar systems, wireless networks, and other fields. However, the inherent cross-polarized (XP) radiation issue severely limits polarization purity, particularly in H-plane [
1]. The primary sources of XP can be categorized as follows: firstly, the excitation of high-order modes; secondly, field-distribution asymmetry caused by feed perturbation [
2,
3]. Low cross-polarization RMAs play a critical role in numerous modern wireless systems demanding stringent polarization purity, owing to their ability to enhance system capacity and accuracy. Major application scenarios include improving spectrum reuse efficiency in satellite communications, ensuring high-resolution radar/remote sensing target identification accuracy, reducing inter-user interference in 5G/6G Massive MIMO systems, and applications in radio astronomy.
Defected ground structure (DGS) has been identified as a major technological solution to such issues, with numerous generations of design schemes having been developed since their initial proposal in 2005 [
4]. DGS achieves the suppression effect by etching a specifically shaped defect in the ground plane that disturbs the field or current associated with XP. Previous studies of DGS focused on structural symmetry or resonance characteristics. Kumar et al. proposed linear DGS [
5] and asymmetric DGS [
6,
7] to effectively attenuate the effect of high-order modes on the feed-side electric field. Pasha et al. proposed a non-proximal DGS [
8,
9], which reconfigured the field distribution by directly interfering with the ground current distribution and accomplished XP suppression in the full plane. Recently, Qian et al. successfully blocked the field propagation path of the TM
02 mode by placing the asymmetric DGS below the patch, thus avoiding the increase in back radiation and providing a decoupled array structure [
10]. Rafidul first proposed an innovative approach combining multi-parameter DGS with machine learning-assisted PSADEA optimization algorithms. Resonant rectangular loop defect and corner orthogonal slits were employed to achieve improvements in XP across the entire azimuth plane [
11]. As indicated above, the current optimization of DGS focuses on three aspects: defect size, defect external shape, and defect location. Beyond suppressing XP radiation, DGS has also made significant contributions in the fields of multibanding and widebanding. Rahman et al. proposed a broadband array antenna for Sub-6 GHz applications featuring a novel matching circuit and DGS, achieving an impedance bandwidth of 70% (3.05–6.32 GHz) [
12]. Wang et al. proposed an antenna structure that achieves tri-band operation through two simple monopoles and an arc-shaped defect, covering the 2.4/5.2/5.8 GHz WLAN and 3.5/5.5 GHz WiMAX bands [
13].
Slot-type DGS proposed in 2015 [
14], as a form of external shape optimization, demonstrates substantial advantages in bandwidth expansion. Sarkar et al. achieved 56.7% impedance bandwidth by integrating the slot-type DGS with a single shorting post [
15]. However, this DGS is limited in terms of design flexibility. It has been demonstrated that the RMA XP level cannot be reduced any further by simply changing the slot length in a specific frequency band. Reference [
14] has shown that the wide angular range of H-plane XP radiation (below −25 dB) can reach 150° at 8.2 GHz, whereas it is merely 100° at 9.8 GHz. Additionally, an excessively large slot area may give rise to undesirable backside radiation. Nevertheless, this observation also implies that larger defect areas offer opportunities for modifying their internal structure.
In this paper, we explore the optimization of the internal structure of the DGS for the first time and overcome the limitations of the RMA with slot-type DGS polarization purity by adding periodic circular structure (PCS) inside the defects, as shown in
Figure 1. The slot-type DGS is unable to fully excite the entire defect due to its large width, whereas the PCS-type DGS exhibits strong coupling with the patch corner field. This coupling consequently instigates substantial alterations in the TM
02 mode field distribution, thereby more efficiently suppressing the XP radiation generated by TM
02. Representative designs of C-band and X-band RMAs are provided. Based on the mode field distribution and far-field simulation, the reasons for the limitations of slot-type DGS and the superiority of PCS-type DGS in XP suppression are analyzed. Next, the investigation is carried out to excite the TM
02 mode in the patch, yielding a peak reduction of 20 dB. Experiments have demonstrated that the X-band RMA based on the PCS-type DGS attains H-plane co-cross polarization isolation of over 25 dB across an azimuth range exceeding 200° and peak XP suppression up to 20 dB.
3. Studies Based on Simulated Results
This comprehensive investigation utilizes the finite element method to simulate coax-fed RMAs placed on various types of DGS. To facilitate comparison with the research reported in [
14], this section employs an RT5870 substrate with a dielectric constant ε
r = 2.33 and thickness h = 1.575 mm.
Figure 2 compares the H-plane radiation characteristics of the C-band RMAs with
W/
L = 1.5 based on the conventional ground plane, slot-type, and PCS-type DGS at 7.25 GHz, providing relevant parameters as well. It is noted that all structures depicted in
Figure 2a exhibit optimal impedance matching, with operating frequency ranges from 7.15 GHz to 7.6 GHz. The corresponding S
11 parameters are displayed in
Figure 2b. We focus on the XP radiation suppression in the H-plane, as illustrated in
Figure 2c. Within an azimuth range of ±100°, the PCS-type DGS XP level demonstrates a degree of improvement over both conventional ground plane and slot-type DGS. The peak co-cross polarization isolation is enhanced by approximately 20 dB and 10 dB, respectively. The gain values exhibit minimal variation, with 8.61 dBi, 8.54 dBi, and 8.73 dBi.
The physical insights underlying the XP behavior of the DGSs are investigated in
Figure 3. The RMA electric fields in the substrate and ground plane currents placed on the three ground plane types are displayed. Notably, all plots maintain identical scales of intensity and phase of input excitation. As in previous studies [
2,
6], the high-order modes of the conventional RMA result in an overall asymmetry of the resonant field below the patch near the probe feed. This asymmetry directly relates to the XP field, as shown in
Figure 3a. The slot-type DGS weakens the TM
02 mode by introducing slotted-defect interactions with the field, thereby effectively reducing XP radiation. Conversely, the slot-type DGS’s relatively substantial width is not necessarily aligned with its operational frequency. This mismatch generates high field strength at the location delineated by the black circle on the defect edge, thereby disrupting the symmetry of the substrate electric field, as shown in
Figure 3b. This phenomenon provides a mechanism for the weakening of XP suppression exhibited by the slot-type DGS when the operating frequency alters. The proposed PCS-type DGS varies the defect field distribution by embedding periodic circular metal elements, as shown in
Figure 3c. In the reconfigured field distribution, the resonant field interacts with high-order mode below the defect, while the PCS effectively mitigates undesirable electric fields within the slot defect. This results in superior symmetry of the substrate electric field inside the defect region.
The XP behavior of the RMA with variable lengths of the slot defect is shown in
Figure 4a. Within the azimuth range of ±100°, the H-plane XP suppression attains its optimal level at
l1 = 36 mm (near the resonant wavelength λ
0). Beyond this range, the suppression capability exhibits a decline, with a variation of ±25° to ±45°. It is evident that when the slot length fails to suppress XP across a broader azimuth range, the implementation of a PCS becomes a viable option. As the circular metal elements’ radius
r increases, more field couples into the slot from the non-radiating side and disperses into the defect gaps between each metal circle, thereby effectively reducing the XP radiation from TM
02 mode, as shown in
Figure 5. Accordingly, the XP behavior of the RMA is illustrated with circular metal elements of variable sizes in
Figure 4b. The manifestation of XP suppression is observed at
r = 1 mm. As
r increases, the XP level within ±100° commences its decline, with peak suppression surpassing 20 dB. When the
r exceeds 2 mm, the XP level outside the ±50° range demonstrates a slight rise. Therefore, the incorporation of PCS serves to augment the XP suppression capacity of the slot-type DGS over a broad azimuth range.
Table 1 presents a summary of PCS design parameters to enhance reproducibility. It has been demonstrated that as the radius
r and the metallization area of the slot region increase, the corresponding cross-polarization suppression capability is concomitantly enhanced. It is notable that when the metallization ratio reaches approximately 25%, the rate of improvement begins to accelerate. Concurrently, the antenna gain demonstrates a slight increase with increasing
r. In addition,
Figure 5 demonstrates the overall impact of the radius on the antenna’s radiation efficiency and front-to-back ratio subsequent to the embedding of the PCS within the slot. As illustrated, radiation efficiency demonstrates an upward trend with increasing radius, while the front-to-back ratio exhibits a downward trend.
The objective of slot-length optimization is to maximize resonance between the slot and the higher-order orthogonal TM
02 mode, while the incorporation of PCS aims to further enhance the coupling between the defect and the TM
02 mode. The coupling between the microstrip and the slot at ground plane is given by [
20],
It is evident that, since remains essentially constant, in order to increase the coupling coefficient , a further reduction in the slot impedance is required. The attachment of metal plates to the slot results in a reduction in its impedance , primarily due to two factors: Firstly, the metal plates introduce additional parallel capacitance, thereby increasing the slot’s equivalent admittance and lowering the impedance magnitude. Secondly, the presence of metal plates within the slot modifies its radiation characteristics, thereby reducing the slot’s radiation resistance. Consequently, the PCS-enhanced higher-order orthogonal modes couple with the slot, significantly suppressing cross-polarization radiation from the non-radiating edges of the patch.
In order to provide an illustration of the working principle of the PCS,
Figure 6 shows the simulated electric-field distribution of the slot-type DGS before and after embedding into the PCS at resonance. It is evident that the input excitation intensity and phase are identical in all cases. The figure provides a clear demonstration of the coupling between the electric field and the DGS, with the coupling strength increasing significantly upon PCS integration. The fringing electric fields, which should be concentrated at the patch corners with mutually opposite polarity, partially couple with the DGS. The primary cause of XP radiation attenuation is the DGS’s weakening effect on the Z-polarized corner fields. As demonstrated in
Figure 6a, in the conventional slot-type DGS, excessive width results in inadequate edge-field excitation of the defect, consequently yielding a weak and asymmetric DGS electric field. As illustrated in
Figure 6b,c, the incorporation of the PCS results in a substantial enhancement of the electric-field strength, attributable to the coupling of the edge field at the patch corner to the DGS. The fringing field uniformly excites the entire defect. This effect is found to intensify as the element radius increases.
In rectangular microstrip antennas, the primary source of XP generation is the TM
02 mode [
21]. The excitation of the TM
02 mode in the H-plane is facilitated by balanced feeding with identical phase and amplitude. As shown in
Figure 7, the TM
02 mode fields are displayed both with and without the DGS. The corresponding radiation patterns are illustrated in
Figure 8.
Figure 7a demonstrates that the vertically polarized-field strength in the proximity of the patch edge exhibits a substantial enhancement. Consequently, peak TM
02 radiation is observed around ±50°. Subsequent to the implementation of a slot-type DGS, see
Figure 7b, a discernible transition in the prevailing orientation of the overall electric field becomes evident. Following the incorporation of the PCS, see
Figure 7c, the fringing field in the patch couples with the PCS-type DGS, causing substantial changes across the entire TM
02 mode field. The vertically polarized field in proximity to the patch edge undergoes coupling with the PCS, thereby reducing the vertical field component and inducing a substantial tilt in the electric field orientation. This phenomenon is particularly evident at the corners. In the corresponding radiation pattern, the azimuth of peak gain increases from 50° to 140°, with TM
02 mode radiation maintaining a low level over a broader azimuth range, as demonstrated in
Figure 8. Research has demonstrated that TM
02 radiation exhibits up to 20 dB attenuation. Furthermore, the PCS-type DGS demonstrates a more significant influence on the TM
02 mode field in comparison to the slot-type DGS, effectively reducing the z-polarized field component at the patch corner and mitigating broadside radiation generated by TM
02 mode.
Figure 9 shows another case demonstrating the S
11 values and the relative radiation patterns of the X-band RMAs with
r = 1.5 in the H-plane at 9.76 GHz. For the purpose of facilitating a more direct comparison with [
14], the same RT5870 substrate (
εr = 2.33,
h = 1.575 mm) is utilized. The impedance bandwidth of the PCS-type DGS is 9.15 GHz–10.18 GHz (bandwidth ratio = 10.65%), representing a 230 MHz improvement over conventional DGSs, as shown in
Figure 9a. This phenomenon is attributed to the microstrip patch antenna cavity model, wherein defects below or in proximity to the patch result in a reduction in the Q factor, thereby widening the impedance bandwidth. In
Figure 9b, it is evident that the azimuth range for 25 dB XP suppression relative to the peak gain is 127°, representing a 27° improvement to [
14]. Moreover, the peak XP suppression has been shown to reach 20 dB. Comparable performance enhancement is also achieved in the C-band, thus providing further validation for the proposed idea.
Figure 10 shows results of rectangular and square patches (
W/
L = 0.8,1, and 1.3) with and without PCS-type DGS. The values of
g and
r for each case are found to be consistent, and it is demonstrated that the optimum value of
l1 increases as
W/
L rises. With the enhancement of
W/
L, the peak XP suppression in the H-plane can be elevated from 10 dB to 21 dB. It is also notable that the suppression effect becomes more significant as
W/
L increases.
4. Experiments and Verification
A set of X-band prototypes bearing the conventional ground plane and PCS-type DGS with their relevant parameters is shown in
Figure 11. Both prototypes employ rectangular patches with a
W/
L ratio of 1.4 and RO4350B substrates (
εr = 3.48,
h = 1.52 mm). The DGS scale is identical to that in
Figure 9. And the 0.5 mm diameter SMA probes are installed by conductive adhesive. The prototypes have been measured using the CEYEAR 3674G network analyzer (Ceyear Technologies Co., Ltd. in Qingdao, China) and an automated anechoic chamber, as shown in
Figure 12.
Figure 13 shows the measured and simulated S
11 characteristics (bandwidth ratio = 10.25%). The simulated results exhibit a high degree of correlation with the measured results. The introduction of the PCS-type DGS causes a small shift to the right in the resonant frequency, due to reactive loading. This has no considerable effect on the input impedance.
Figure 14 shows the simulated three-dimensional radiation patterns with PCS-type DGS.
Figure 15 shows both measured and simulated radiation patterns obtained in two principal planes at the resonant frequency.
Figure 15a shows that the PCS-type DGS has no significant effect on radiation patterns in the E-plane, which maintains a low XP level across all azimuth angles. As shown in
Figure 15b, the beamwidth of the H-plane co-polarized pattern exhibits a slight decrease in comparison without DGS, which can be attributed to the field redistribution. Concurrently, XP suppression in the H-plane is excellent, yielding peak XP suppression levels of up to 20 dB. Within the 214° azimuth range delineated, only a 10° XP level fails to decrease by 25 dB relative to peak gain. The azimuth range where XP values fall below −25 dB expands from 48° to 204° through the introduction of the proposed PCS-type DGS.
Figure 16 shows both measured and simulated results of the variation in gain with frequency. The measured data closely corroborate the simulated predictions.
Figure 17 presents the order of consistency of the characteristics over the entire bandwidth. The order of peak suppression varies from the lower band edge to the upper band edge, displaying an approximate range of 15–22 dB.
Table 2 compares the measured RMA XP metrics of the proposed DGS with various representative resonant-type DGSs. In the case of the RMA with a large
W/
L ratio, the proposed PCS-type DGS exhibits superior capability in maintaining a low XP level across a wide azimuth angle while retaining a lower defect area. Compared to the currently popular asymmetric DGS (L-shape), PCS-type DGS as a symmetric DGS achieves comparable performance while featuring a simpler design.