A Reproducible FPGA-to-Silicon Verification Methodology for an Embedded SoC Platform in 28 nm CMOS
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Sun, H.; Ryoo, K. A Reproducible FPGA-to-Silicon Verification Methodology for an Embedded SoC Platform in 28 nm CMOS. Electronics 2026, 15, 2202. https://doi.org/10.3390/electronics15102202
Sun H, Ryoo K. A Reproducible FPGA-to-Silicon Verification Methodology for an Embedded SoC Platform in 28 nm CMOS. Electronics. 2026; 15(10):2202. https://doi.org/10.3390/electronics15102202
Chicago/Turabian StyleSun, Hyeseung, and Kwangki Ryoo. 2026. "A Reproducible FPGA-to-Silicon Verification Methodology for an Embedded SoC Platform in 28 nm CMOS" Electronics 15, no. 10: 2202. https://doi.org/10.3390/electronics15102202
APA StyleSun, H., & Ryoo, K. (2026). A Reproducible FPGA-to-Silicon Verification Methodology for an Embedded SoC Platform in 28 nm CMOS. Electronics, 15(10), 2202. https://doi.org/10.3390/electronics15102202

