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Journal: Electronics, 2025
Volume: 14
Number: 1528
Article:
An Analog Circuit Fault Diagnosis Method Incorporating Multi-Objective Selection of Measurement Nodes
Authors:
by
Yating Chang, Xianglian Xu, Kaitian Deng, Yuli Xu, Binge Tu, Xinrong Gao and Qingjie Wei
Link:
https://www.mdpi.com/2079-9292/14/8/1528
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