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Journal: ElectronicsVolume: 14Number: 1528
Article: An Analog Circuit Fault Diagnosis Method Incorporating Multi-Objective Selection of Measurement Nodes
  • Authors:
  • Yating Chang,
  • Xianglian Xu* and
  • Kaitian Deng
  • et al.
Link: https://www.mdpi.com/2079-9292/14/8/1528

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