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Journal: Electronics, 2025
Volume: 14
Number: 1528

Article: An Analog Circuit Fault Diagnosis Method Incorporating Multi-Objective Selection of Measurement Nodes
Authors: by Yating Chang, Xianglian Xu, Kaitian Deng, Yuli Xu, Binge Tu, Xinrong Gao and Qingjie Wei
Link: https://www.mdpi.com/2079-9292/14/8/1528

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