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Journal: Electronics, 2025
Volume: 14
Number: 1351
Article:
Novel Learning Framework with Generative AI X-Ray Images for Deep Neural Network-Based X-Ray Security Inspection of Prohibited Items Detection with You Only Look Once
Authors:
by
Dongsik Kim and Jinho Kang
Link:
https://www.mdpi.com/2079-9292/14/7/1351
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