Deep Learning-Based Train Obstacle Detection Technology: Application and Testing in Metros
Abstract
:1. Introduction
2. Obstacle Detection System
3. Obstacle Detection System Testing Methods
3.1. Object Detection Technology Based on Deep Learning
3.2. Measurement Methods for Deep Learning Systems
4. Experiment
4.1. ITE System
4.2. Two Modes of ITE System
4.3. Black-Box Testing in LH Mode
4.4. White-Box Testing in LE Mode
5. Discussion
6. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Input Conditions | Straight Track | Track | Curve | Slope |
---|---|---|---|---|
Obstacle Distance (L1) | Obstacle Distance (L2) | Obstacle Distance (L3) | Obstacle Distance (L4) | |
Effective Equivalence Class | 30 m m (1) | 30 m m (2) | 30 m m (3) | 30 m m (4) |
Ineffective Equivalence Class | m (5) | m (7) | m (9) | m (11) |
m (6) | m (8) | m (10) | m (12) |
Neuron Coverage Metric (%) | Parameter Selection | Original Dataset Test Results | Expanded Dataset Test Results |
---|---|---|---|
KMNC (%) | k = 100 | 37.5 | 47.8 |
k = 500 | 24.8 | 26.5 | |
NBC (%) | LB = 0.5, UB = 0.9 | 3.76 | 3.9 |
SNAC (%) | UB = 0.9 | 0.62 | 0.66 |
k = 10 | 1.23 | 1.36 | |
TKNC (%) | k = 100 | 4.33 | 4.58 |
k = 1000 | 7.86 | 8.13 |
Positive Sample | Negative Sample | |
---|---|---|
Predicted positive | Predict positive sample as positive sample | Predict negative sample as positive sample |
(true positive, TP) | (false positive, FP) | |
Predicted negative | Predict positive sample as negative sample | Predict negative sample as negative sample |
(false negative, FN) | (true negative, TN) |
Evaluation Object | Evaluation Metric | Result |
---|---|---|
mAP | IoU = 0.50:0.95, area = all, maxDets = 100 | 0.764 |
IoU = 0.50, area = all, maxDets = 100 | 0.991 | |
IoU = 0.75, area = all, maxDets = 100 | 0.867 | |
IoU = 0.50:0.95, area = small, maxDets = 100 | 0.421 | |
IoU = 0.50:0.95, area = medium, maxDets = 100 | 0.695 | |
IoU = 0.50:0.95, area = large, maxDets = 100 | 0.861 |
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Yan, F.; Gu, Y.; Sun, Y. Deep Learning-Based Train Obstacle Detection Technology: Application and Testing in Metros. Electronics 2025, 14, 1318. https://doi.org/10.3390/electronics14071318
Yan F, Gu Y, Sun Y. Deep Learning-Based Train Obstacle Detection Technology: Application and Testing in Metros. Electronics. 2025; 14(7):1318. https://doi.org/10.3390/electronics14071318
Chicago/Turabian StyleYan, Fei, Yiran Gu, and Yunlai Sun. 2025. "Deep Learning-Based Train Obstacle Detection Technology: Application and Testing in Metros" Electronics 14, no. 7: 1318. https://doi.org/10.3390/electronics14071318
APA StyleYan, F., Gu, Y., & Sun, Y. (2025). Deep Learning-Based Train Obstacle Detection Technology: Application and Testing in Metros. Electronics, 14(7), 1318. https://doi.org/10.3390/electronics14071318