Liang, H.; Li, J.; Sun, J.; Wang, D.; Wang, F.; Wang, D.; Liu, J.
High-Voltage Electrostatic Discharge/Electrical Overstress Co-Protection Implementing Gradual-Triggered SCR and MOS-Stacked Configuration. Electronics 2025, 14, 1076.
https://doi.org/10.3390/electronics14061076
AMA Style
Liang H, Li J, Sun J, Wang D, Wang F, Wang D, Liu J.
High-Voltage Electrostatic Discharge/Electrical Overstress Co-Protection Implementing Gradual-Triggered SCR and MOS-Stacked Configuration. Electronics. 2025; 14(6):1076.
https://doi.org/10.3390/electronics14061076
Chicago/Turabian Style
Liang, Hailian, Jianfeng Li, Jun Sun, Dejin Wang, Fang Wang, Dong Wang, and Junliang Liu.
2025. "High-Voltage Electrostatic Discharge/Electrical Overstress Co-Protection Implementing Gradual-Triggered SCR and MOS-Stacked Configuration" Electronics 14, no. 6: 1076.
https://doi.org/10.3390/electronics14061076
APA Style
Liang, H., Li, J., Sun, J., Wang, D., Wang, F., Wang, D., & Liu, J.
(2025). High-Voltage Electrostatic Discharge/Electrical Overstress Co-Protection Implementing Gradual-Triggered SCR and MOS-Stacked Configuration. Electronics, 14(6), 1076.
https://doi.org/10.3390/electronics14061076
