Bajenaid, A.; Khemakhem, M.; Eassa, F.E.; Bourennani, F.; Qurashi, J.M.; Alsulami, A.A.; Alturki, B.
Towards Robust SDN Security: A Comparative Analysis of Oversampling Techniques with ML and DL Classifiers. Electronics 2025, 14, 995.
https://doi.org/10.3390/electronics14050995
AMA Style
Bajenaid A, Khemakhem M, Eassa FE, Bourennani F, Qurashi JM, Alsulami AA, Alturki B.
Towards Robust SDN Security: A Comparative Analysis of Oversampling Techniques with ML and DL Classifiers. Electronics. 2025; 14(5):995.
https://doi.org/10.3390/electronics14050995
Chicago/Turabian Style
Bajenaid, Aboubakr, Maher Khemakhem, Fathy E. Eassa, Farid Bourennani, Junaid M. Qurashi, Abdulaziz A. Alsulami, and Badraddin Alturki.
2025. "Towards Robust SDN Security: A Comparative Analysis of Oversampling Techniques with ML and DL Classifiers" Electronics 14, no. 5: 995.
https://doi.org/10.3390/electronics14050995
APA Style
Bajenaid, A., Khemakhem, M., Eassa, F. E., Bourennani, F., Qurashi, J. M., Alsulami, A. A., & Alturki, B.
(2025). Towards Robust SDN Security: A Comparative Analysis of Oversampling Techniques with ML and DL Classifiers. Electronics, 14(5), 995.
https://doi.org/10.3390/electronics14050995