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Electronics
Volume 14
Issue 4
10.3390/electronics14040763
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Journal: Electronics, 2025
Volume: 14
Number: 763

Article: Experimental Study of the Comparison of the Synergistic Effect of Total Ionizing Dose and Neutron Single Event on Si/SiC MOSFETs
Authors: by Wangtian Li, Gang Guo, Qiming Chen, Zheng Zhang, Shuyong Zhao, Jiancheng Liu and Fengdi Qin
Link: https://www.mdpi.com/2079-9292/14/4/763

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