Kehl, P.E.; Ansari, J.; Lovrin, M.; Mohanram, P.; Liu, C.-C.; Yeh, J.-L.; Schmitt, R.H.
5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability. Electronics 2025, 14, 758.
https://doi.org/10.3390/electronics14040758
AMA Style
Kehl PE, Ansari J, Lovrin M, Mohanram P, Liu C-C, Yeh J-L, Schmitt RH.
5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability. Electronics. 2025; 14(4):758.
https://doi.org/10.3390/electronics14040758
Chicago/Turabian Style
Kehl, Pierre E., Junaid Ansari, Mikael Lovrin, Praveen Mohanram, Chi-Chuan (Eric) Liu, Jun-Lin (Larry) Yeh, and Robert H. Schmitt.
2025. "5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability" Electronics 14, no. 4: 758.
https://doi.org/10.3390/electronics14040758
APA Style
Kehl, P. E., Ansari, J., Lovrin, M., Mohanram, P., Liu, C.-C., Yeh, J.-L., & Schmitt, R. H.
(2025). 5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability. Electronics, 14(4), 758.
https://doi.org/10.3390/electronics14040758