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Journal: Electronics, 2025
Volume: 14
Number: 499
Article:
Design Strategies for BCAT Structures: Enhancing DRAM Reliability and Mitigating Row Hammer Effect
Authors:
by
Jisung Im, Hansol Kim, Hyungjin Kim and Sung Yun Woo
Link:
https://www.mdpi.com/2079-9292/14/3/499
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