Research on Time–Frequency Domain Characteristics Analysis of Fault Arc Under Different Connection Methods
Abstract
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Zeng, S.; Lei, L.; Tian, G.; Li, Y.; Wang, J. Research on Time–Frequency Domain Characteristics Analysis of Fault Arc Under Different Connection Methods. Electronics 2025, 14, 4840. https://doi.org/10.3390/electronics14244840
Zeng S, Lei L, Tian G, Li Y, Wang J. Research on Time–Frequency Domain Characteristics Analysis of Fault Arc Under Different Connection Methods. Electronics. 2025; 14(24):4840. https://doi.org/10.3390/electronics14244840
Chicago/Turabian StyleZeng, Siyuan, Lei Lei, Gang Tian, Yimin Li, and Jianhua Wang. 2025. "Research on Time–Frequency Domain Characteristics Analysis of Fault Arc Under Different Connection Methods" Electronics 14, no. 24: 4840. https://doi.org/10.3390/electronics14244840
APA StyleZeng, S., Lei, L., Tian, G., Li, Y., & Wang, J. (2025). Research on Time–Frequency Domain Characteristics Analysis of Fault Arc Under Different Connection Methods. Electronics, 14(24), 4840. https://doi.org/10.3390/electronics14244840

