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Journal: Electronics, 2025
Volume: 14
Number: 4650
Article:
AI-Driven Adaptive Segmentation of Timed Up and Go Test Phases Using a Smartphone
Authors:
by
Muntazir Rashid, Arshad Sher, Federico Villagra Povina and Otar Akanyeti
Link:
https://www.mdpi.com/2079-9292/14/23/4650
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