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Journal: Electronics, 2025
Volume: 14
Number: 4600

Article: Fault Injection Tool for FPGA Reliability Testing: A Novel Method and Discovery of LUT-Specific Logical Redundancies
Authors: by Mariusz Węgrzyn, Orest Kochan and Ihor Maikiv
Link: https://www.mdpi.com/2079-9292/14/23/4600

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