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Journal: Electronics, 2025
Volume: 14
Number: 4582

Article: Emulation-Based Analysis of Multiple Cell Upsets in LEON3 SDRAM: A Workload-Dependent Vulnerability Study
Authors: by Afef Kchaou, Sehmi Saad and Hatem Garrab
Link: https://www.mdpi.com/2079-9292/14/23/4582

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