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Journal: Electronics, 2025
Volume: 14
Number: 4582
Article:
Emulation-Based Analysis of Multiple Cell Upsets in LEON3 SDRAM: A Workload-Dependent Vulnerability Study
Authors:
by
Afef Kchaou, Sehmi Saad and Hatem Garrab
Link:
https://www.mdpi.com/2079-9292/14/23/4582
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