Next Article in Journal
Impact of Physical and Material Parameters on the Threshold Voltage and the Channel Resistance of Nanowire Field-Effect Transistors for Advanced Nanoscale Devices
Previous Article in Journal
A Rapid and Self-Contained Calibration Method for MIMUs Based on Residual Velocity Measurement
 
 
Article

Article Versions Notes

Electronics 2025, 14(21), 4278; https://doi.org/10.3390/electronics14214278
Action Date Notes Link
article html file updated 31 October 2025 10:31 CET Original file https://www.mdpi.com/2079-9292/14/21/4278/html
article pdf uploaded. 31 October 2025 10:29 CET Version of Record https://www.mdpi.com/2079-9292/14/21/4278/pdf
article xml uploaded. 31 October 2025 10:29 CET Update https://www.mdpi.com/2079-9292/14/21/4278/xml
article xml file uploaded 31 October 2025 10:29 CET Original file -
Back to TopTop