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Journal: Electronics, 2025
Volume: 14
Number: 4168

Article: HiSeq-TCN: High-Dimensional Feature Sequence Modeling and Few-Shot Reinforcement Learning for Intrusion Detection
Authors: by Yadong Pei, Yanfei Tan, Wei Gao, Fangwei Li and Mingyue Wang
Link: https://www.mdpi.com/2079-9292/14/21/4168

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