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Journal: ElectronicsVolume: 14Number: 4168
Article: HiSeq-TCN: High-Dimensional Feature Sequence Modeling and Few-Shot Reinforcement Learning for Intrusion Detection
  • Authors:
  • Yadong Pei1,2,
  • Yanfei Tan1,2 and
  • Wei Gao1,2
  • et al.
Link: https://www.mdpi.com/2079-9292/14/21/4168

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