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Journal: Electronics, 2025
Volume: 14
Number: 4168
Article:
HiSeq-TCN: High-Dimensional Feature Sequence Modeling and Few-Shot Reinforcement Learning for Intrusion Detection
Authors:
by
Yadong Pei, Yanfei Tan, Wei Gao, Fangwei Li and Mingyue Wang
Link:
https://www.mdpi.com/2079-9292/14/21/4168
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