Huang, C.; Wei, J.; Yan, Y.; Zhang, K.; Zhang, S.; Sun, Y.; Wang, T.
Failure Mechanism Analysis and Electromagnetic Protection Design of Electronic Systems Under High-Power Electromagnetic Pulse. Electronics 2025, 14, 4060.
https://doi.org/10.3390/electronics14204060
AMA Style
Huang C, Wei J, Yan Y, Zhang K, Zhang S, Sun Y, Wang T.
Failure Mechanism Analysis and Electromagnetic Protection Design of Electronic Systems Under High-Power Electromagnetic Pulse. Electronics. 2025; 14(20):4060.
https://doi.org/10.3390/electronics14204060
Chicago/Turabian Style
Huang, Chenxi, Jinhong Wei, Youjie Yan, Kaiyue Zhang, Shoulong Zhang, Yifei Sun, and Tongyu Wang.
2025. "Failure Mechanism Analysis and Electromagnetic Protection Design of Electronic Systems Under High-Power Electromagnetic Pulse" Electronics 14, no. 20: 4060.
https://doi.org/10.3390/electronics14204060
APA Style
Huang, C., Wei, J., Yan, Y., Zhang, K., Zhang, S., Sun, Y., & Wang, T.
(2025). Failure Mechanism Analysis and Electromagnetic Protection Design of Electronic Systems Under High-Power Electromagnetic Pulse. Electronics, 14(20), 4060.
https://doi.org/10.3390/electronics14204060
