Vasil’evskii, I.S.; Klochkov, A.N.; Nekrasov, P.V.; Vinichenko, A.N.; Kargin, N.I.; Yskakov, A.; Bulavin, M.V.; Galushko, A.V.; Bekbayev, A.; Mukhametuly, B.;
et al. Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence. Electronics 2025, 14, 3802.
https://doi.org/10.3390/electronics14193802
AMA Style
Vasil’evskii IS, Klochkov AN, Nekrasov PV, Vinichenko AN, Kargin NI, Yskakov A, Bulavin MV, Galushko AV, Bekbayev A, Mukhametuly B,
et al. Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence. Electronics. 2025; 14(19):3802.
https://doi.org/10.3390/electronics14193802
Chicago/Turabian Style
Vasil’evskii, Ivan S., Aleksey N. Klochkov, Pavel V. Nekrasov, Aleksander N. Vinichenko, Nikolay I. Kargin, Almas Yskakov, Maksim V. Bulavin, Aleksey V. Galushko, Askhat Bekbayev, Bagdaulet Mukhametuly,
and et al. 2025. "Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence" Electronics 14, no. 19: 3802.
https://doi.org/10.3390/electronics14193802
APA Style
Vasil’evskii, I. S., Klochkov, A. N., Nekrasov, P. V., Vinichenko, A. N., Kargin, N. I., Yskakov, A., Bulavin, M. V., Galushko, A. V., Bekbayev, A., Mukhametuly, B., Myrzabekova, E., Shegebayev, N., Kulikbayeva, D., Nurulin, R., Nurkasova, A., & Baitugulov, R.
(2025). Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence. Electronics, 14(19), 3802.
https://doi.org/10.3390/electronics14193802
