Aftab Uddin, S.M.;                     Yaseen, M.;                     Chowdhury, M.K.H.;                     Rabeya, R.A.;                     Uddin, S.M.I.;                     Kim, H.-C.    
        DeepFocusNet: An Attention-Augmented Deep Neural Framework for Robust Colorectal Cancer Classification in Whole-Slide Histology Images. Electronics 2025, 14, 3731.
    https://doi.org/10.3390/electronics14183731
    AMA Style
    
                                Aftab Uddin SM,                                 Yaseen M,                                 Chowdhury MKH,                                 Rabeya RA,                                 Uddin SMI,                                 Kim H-C.        
                DeepFocusNet: An Attention-Augmented Deep Neural Framework for Robust Colorectal Cancer Classification in Whole-Slide Histology Images. Electronics. 2025; 14(18):3731.
        https://doi.org/10.3390/electronics14183731
    
    Chicago/Turabian Style
    
                                Aftab Uddin, Shah Md,                                 Muhammad Yaseen,                                 Md Kamran Hussain Chowdhury,                                 Rubina Akter Rabeya,                                 Shah Muhammad Imtiyaj Uddin,                                 and Hee-Cheol Kim.        
                2025. "DeepFocusNet: An Attention-Augmented Deep Neural Framework for Robust Colorectal Cancer Classification in Whole-Slide Histology Images" Electronics 14, no. 18: 3731.
        https://doi.org/10.3390/electronics14183731
    
    APA Style
    
                                Aftab Uddin, S. M.,                                 Yaseen, M.,                                 Chowdhury, M. K. H.,                                 Rabeya, R. A.,                                 Uddin, S. M. I.,                                 & Kim, H.-C.        
        
        (2025). DeepFocusNet: An Attention-Augmented Deep Neural Framework for Robust Colorectal Cancer Classification in Whole-Slide Histology Images. Electronics, 14(18), 3731.
        https://doi.org/10.3390/electronics14183731