Younes, R.; Abou Daher, M.; Samnouni, M.; Lepilliet, S.; Ducournau, G.; Wichmann, N.; Bollaert, S.
Development of an Extended-Band mTRL Calibration Kit for On-Wafer Characterization of InP-HEMTs up to 1.1 THz. Electronics 2025, 14, 3472.
https://doi.org/10.3390/electronics14173472
AMA Style
Younes R, Abou Daher M, Samnouni M, Lepilliet S, Ducournau G, Wichmann N, Bollaert S.
Development of an Extended-Band mTRL Calibration Kit for On-Wafer Characterization of InP-HEMTs up to 1.1 THz. Electronics. 2025; 14(17):3472.
https://doi.org/10.3390/electronics14173472
Chicago/Turabian Style
Younes, Rita, Mahmoud Abou Daher, Mohammed Samnouni, Sylvie Lepilliet, Guillaume Ducournau, Nicolas Wichmann, and Sylvain Bollaert.
2025. "Development of an Extended-Band mTRL Calibration Kit for On-Wafer Characterization of InP-HEMTs up to 1.1 THz" Electronics 14, no. 17: 3472.
https://doi.org/10.3390/electronics14173472
APA Style
Younes, R., Abou Daher, M., Samnouni, M., Lepilliet, S., Ducournau, G., Wichmann, N., & Bollaert, S.
(2025). Development of an Extended-Band mTRL Calibration Kit for On-Wafer Characterization of InP-HEMTs up to 1.1 THz. Electronics, 14(17), 3472.
https://doi.org/10.3390/electronics14173472