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Journal: Electronics, 2025
Volume: 14
Number: 3447

Article: Super-Resolved Pseudo Reference in Dual-Branch Embedding for Blind Ultra-High-Definition Image Quality Assessment
Authors: by Jiacheng Gu, Qingxu Meng, Songnan Zhao, Yifan Wang, Shaode Yu and Qiurui Sun
Link: https://www.mdpi.com/2079-9292/14/17/3447

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