Gu, J.; Meng, Q.; Zhao, S.; Wang, Y.; Yu, S.; Sun, Q.
Super-Resolved Pseudo Reference in Dual-Branch Embedding for Blind Ultra-High-Definition Image Quality Assessment. Electronics 2025, 14, 3447.
https://doi.org/10.3390/electronics14173447
AMA Style
Gu J, Meng Q, Zhao S, Wang Y, Yu S, Sun Q.
Super-Resolved Pseudo Reference in Dual-Branch Embedding for Blind Ultra-High-Definition Image Quality Assessment. Electronics. 2025; 14(17):3447.
https://doi.org/10.3390/electronics14173447
Chicago/Turabian Style
Gu, Jiacheng, Qingxu Meng, Songnan Zhao, Yifan Wang, Shaode Yu, and Qiurui Sun.
2025. "Super-Resolved Pseudo Reference in Dual-Branch Embedding for Blind Ultra-High-Definition Image Quality Assessment" Electronics 14, no. 17: 3447.
https://doi.org/10.3390/electronics14173447
APA Style
Gu, J., Meng, Q., Zhao, S., Wang, Y., Yu, S., & Sun, Q.
(2025). Super-Resolved Pseudo Reference in Dual-Branch Embedding for Blind Ultra-High-Definition Image Quality Assessment. Electronics, 14(17), 3447.
https://doi.org/10.3390/electronics14173447