Zhu, B.; Shen, X.; Liu, T.; Wang, S.; Hang, Y.; Mo, J.; Shao, L.; Wang, R.
Residual Skewness Monitoring-Based Estimation Method for Laser-Induced Breakdown Spectroscopy. Electronics 2025, 14, 3343.
https://doi.org/10.3390/electronics14173343
AMA Style
Zhu B, Shen X, Liu T, Wang S, Hang Y, Mo J, Shao L, Wang R.
Residual Skewness Monitoring-Based Estimation Method for Laser-Induced Breakdown Spectroscopy. Electronics. 2025; 14(17):3343.
https://doi.org/10.3390/electronics14173343
Chicago/Turabian Style
Zhu, Bin, Xiangcheng Shen, Tao Liu, Sirui Wang, Yuhua Hang, Jianhua Mo, Lei Shao, and Ruizhi Wang.
2025. "Residual Skewness Monitoring-Based Estimation Method for Laser-Induced Breakdown Spectroscopy" Electronics 14, no. 17: 3343.
https://doi.org/10.3390/electronics14173343
APA Style
Zhu, B., Shen, X., Liu, T., Wang, S., Hang, Y., Mo, J., Shao, L., & Wang, R.
(2025). Residual Skewness Monitoring-Based Estimation Method for Laser-Induced Breakdown Spectroscopy. Electronics, 14(17), 3343.
https://doi.org/10.3390/electronics14173343