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Journal: Electronics, 2025
Volume: 14
Number: 3101

Article: Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs
Authors: by Jianguang Du, Bo Li, Zhenyu Chen, Lian Shen, Pufan Liu and Zhongyang Ran
Link: https://www.mdpi.com/2079-9292/14/15/3101

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