Du, J.; Li, B.; Chen, Z.; Shen, L.; Liu, P.; Ran, Z.
Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs. Electronics 2025, 14, 3101.
https://doi.org/10.3390/electronics14153101
AMA Style
Du J, Li B, Chen Z, Shen L, Liu P, Ran Z.
Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs. Electronics. 2025; 14(15):3101.
https://doi.org/10.3390/electronics14153101
Chicago/Turabian Style
Du, Jianguang, Bo Li, Zhenyu Chen, Lian Shen, Pufan Liu, and Zhongyang Ran.
2025. "Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs" Electronics 14, no. 15: 3101.
https://doi.org/10.3390/electronics14153101
APA Style
Du, J., Li, B., Chen, Z., Shen, L., Liu, P., & Ran, Z.
(2025). Knowledge-Augmented Zero-Shot Method for Power Equipment Defect Grading with Chain-of-Thought LLMs. Electronics, 14(15), 3101.
https://doi.org/10.3390/electronics14153101