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Journal: Electronics, 2025
Volume: 14
Number: 2465

Article: Quantifying Cyber Resilience: A Framework Based on Availability Metrics and AUC-Based Normalization
Authors: by Harksu Cho, Ji-Hyun Sung, Hye-Jin Kang, Jisoo Jang and Dongkyoo Shin
Link: https://www.mdpi.com/2079-9292/14/12/2465

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