Zhang, W.; Shi, J.; Zhu, X.; Lu, Z.; Liu, H.; Zhu, X.
Design and Testing of Nanovolt-Level Low-Noise Ag-AgCl Electrodes for Expendable Current Profilers. Electronics 2025, 14, 2402.
https://doi.org/10.3390/electronics14122402
AMA Style
Zhang W, Shi J, Zhu X, Lu Z, Liu H, Zhu X.
Design and Testing of Nanovolt-Level Low-Noise Ag-AgCl Electrodes for Expendable Current Profilers. Electronics. 2025; 14(12):2402.
https://doi.org/10.3390/electronics14122402
Chicago/Turabian Style
Zhang, Wen, Jian Shi, Xiaoqian Zhu, Zibo Lu, Huanrui Liu, and Xinyang Zhu.
2025. "Design and Testing of Nanovolt-Level Low-Noise Ag-AgCl Electrodes for Expendable Current Profilers" Electronics 14, no. 12: 2402.
https://doi.org/10.3390/electronics14122402
APA Style
Zhang, W., Shi, J., Zhu, X., Lu, Z., Liu, H., & Zhu, X.
(2025). Design and Testing of Nanovolt-Level Low-Noise Ag-AgCl Electrodes for Expendable Current Profilers. Electronics, 14(12), 2402.
https://doi.org/10.3390/electronics14122402