Next Article in Journal
Design and Testing of Nanovolt-Level Low-Noise Ag-AgCl Electrodes for Expendable Current Profilers
Previous Article in Journal
STALE: A Scalable and Secure Trans-Border Authentication Scheme Leveraging Email and ECDH Key Exchange
 
 
Article

Article Versions Notes

Electronics 2025, 14(12), 2400; https://doi.org/10.3390/electronics14122400
Action Date Notes Link
article xml file uploaded 12 June 2025 12:28 CEST Original file -
article xml uploaded. 12 June 2025 12:28 CEST Update -
article pdf uploaded. 12 June 2025 12:28 CEST Version of Record https://www.mdpi.com/2079-9292/14/12/2400/pdf-vor
article html file updated 12 June 2025 12:33 CEST Original file -
article xml file uploaded 13 June 2025 02:40 CEST Update -
article xml uploaded. 13 June 2025 02:40 CEST Update https://www.mdpi.com/2079-9292/14/12/2400/xml
article pdf uploaded. 13 June 2025 02:40 CEST Updated version of record https://www.mdpi.com/2079-9292/14/12/2400/pdf
article html file updated 13 June 2025 02:44 CEST Update -
article html file updated 25 June 2025 09:19 CEST Update https://www.mdpi.com/2079-9292/14/12/2400/html
Back to TopTop